Joonsung Park, Jae-Wook Lee, Jaeyong Chung, Kihyuk Han, Jacob A. Abraham, Eonjo Byun, Cheol-Jong Woo, Sejang Oh. At-speed Test of High-Speed DUT Using Built-Off Test Interface. In Proceedings of the 19th IEEE Asian Test Symposium, ATS 2010, 1-4 December 2010, Shanghai, China. pages 269-274, IEEE Computer Society, 2010. [doi]
Abstract is missing.