Hyun Woong Park, Sang-Jun Lee, Dong-Chul Cho, Sang-Hoon Lee, Jae-Kyun Kim, Jun-Hee Lee, Sang-Kyo Jung, Hong-Sik Nam, Patrick Hsu, Shin Low, Sung-hwan Lim. Behavior of Au and Pd and the effects of these metals on IMCs in Pd-Au-coated copper wire. Microelectronics Reliability, 91:283-290, 2018. [doi]
Abstract is missing.