Jisung Park, Sungjin Lee, Jihong Kim. DAC: Dedup-assisted compression scheme for improving lifetime of NAND storage systems. In David Atienza, Giorgio Di Natale, editors, Design, Automation & Test in Europe Conference & Exhibition, DATE 2017, Lausanne, Switzerland, March 27-31, 2017. pages 1249-1252, IEEE, 2017. [doi]
@inproceedings{ParkLK17-3,
title = {DAC: Dedup-assisted compression scheme for improving lifetime of NAND storage systems},
author = {Jisung Park and Sungjin Lee and Jihong Kim},
year = {2017},
doi = {10.23919/DATE.2017.7927181},
url = {https://doi.org/10.23919/DATE.2017.7927181},
researchr = {https://researchr.org/publication/ParkLK17-3},
cites = {0},
citedby = {0},
pages = {1249-1252},
booktitle = {Design, Automation & Test in Europe Conference & Exhibition, DATE 2017, Lausanne, Switzerland, March 27-31, 2017},
editor = {David Atienza and Giorgio Di Natale},
publisher = {IEEE},
isbn = {978-3-9815370-8-6},
}