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Characterizing the Current Degradation of Abnormally Structured MOS Transistors Using a 3D Poisson Solver

Jin-Kyu Park, Keun-Ho Lee, Chang-Sub Lee, Gi-Young Yang, Young-Kwan Park, Jeong-Taek Kong. Characterizing the Current Degradation of Abnormally Structured MOS Transistors Using a 3D Poisson Solver. In ISQED. pages 322-325, 2002. [doi]

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Jin-Kyu Park

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Keun-Ho Lee

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Chang-Sub Lee

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Gi-Young Yang

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Young-Kwan Park

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Jeong-Taek Kong

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