Jin-Kyu Park, Keun-Ho Lee, Chang-Sub Lee, Gi-Young Yang, Young-Kwan Park, Jeong-Taek Kong. Characterizing the Current Degradation of Abnormally Structured MOS Transistors Using a 3D Poisson Solver. In ISQED. pages 322-325, 2002. [doi]
@inproceedings{ParkLLYPK02,
title = {Characterizing the Current Degradation of Abnormally Structured MOS Transistors Using a 3D Poisson Solver},
author = {Jin-Kyu Park and Keun-Ho Lee and Chang-Sub Lee and Gi-Young Yang and Young-Kwan Park and Jeong-Taek Kong},
year = {2002},
url = {http://computer.org/proceedings/isqed/1561/15610322abs.htm},
researchr = {https://researchr.org/publication/ParkLLYPK02},
cites = {0},
citedby = {0},
pages = {322-325},
booktitle = {ISQED},
}