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Nohpill Park, Fabrizio Lombardi, Vincenzo Piuri. Testing and evaluating the quality-level of stratified multichip module instrumentation. IEEE T. Instrumentation and Measurement, 50(6):1615-1624, 2001. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Stratified Testing of Multichip Module Systems under Uneven Known-Good-YieldNohpill Park, Fabrizio Lombardi. dft 1999: 192-200 [doi] Analysis of stratified testing for multichip module systemsNohpill Park, Fabrizio Lombardi. tr, 51(1):100-110, 2002. [doi]
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