Sungbong Park, ChangKyu Lee, Sangcheon Park, Haeyong Park, Taeheon Lee, Dami Park, Minsung Heo, Inyong Park, Hyunyoung Yeo, Youna Lee, Juhee Lee, Beomsuk Lee, Dong-Chul Lee, Jinyoung Kim, Bokwon Kim, Jinsun Pyo, Shili Quan, Sungyong You, Inho Ro, Sungsoo Choi, SungIn Kim, Insung Joe, JongEun Park, Chang-Hyo Koo, Jae-Ho Kim, Chong Kwang Chang, Taehee Kim, Jingyun Kim, Jamie Lee, Hyunchul Kim, Changrok Moon, Hyoung-Sub Kim. A 64Mpixel CMOS Image Sensor with 0.50µm Unit Pixels Separated by Front Deep-Trench Isolation. In IEEE International Solid-State Circuits Conference, ISSCC 2022, San Francisco, CA, USA, February 20-26, 2022. pages 1-3, IEEE, 2022. [doi]
@inproceedings{ParkLPPLPHPYLLL22,
title = {A 64Mpixel CMOS Image Sensor with 0.50µm Unit Pixels Separated by Front Deep-Trench Isolation},
author = {Sungbong Park and ChangKyu Lee and Sangcheon Park and Haeyong Park and Taeheon Lee and Dami Park and Minsung Heo and Inyong Park and Hyunyoung Yeo and Youna Lee and Juhee Lee and Beomsuk Lee and Dong-Chul Lee and Jinyoung Kim and Bokwon Kim and Jinsun Pyo and Shili Quan and Sungyong You and Inho Ro and Sungsoo Choi and SungIn Kim and Insung Joe and JongEun Park and Chang-Hyo Koo and Jae-Ho Kim and Chong Kwang Chang and Taehee Kim and Jingyun Kim and Jamie Lee and Hyunchul Kim and Changrok Moon and Hyoung-Sub Kim},
year = {2022},
doi = {10.1109/ISSCC42614.2022.9731750},
url = {https://doi.org/10.1109/ISSCC42614.2022.9731750},
researchr = {https://researchr.org/publication/ParkLPPLPHPYLLL22},
cites = {0},
citedby = {0},
pages = {1-3},
booktitle = {IEEE International Solid-State Circuits Conference, ISSCC 2022, San Francisco, CA, USA, February 20-26, 2022},
publisher = {IEEE},
isbn = {978-1-6654-2800-2},
}