Sang Phill Park, Dongsoo Lee, Kaushik Roy. Soft-Error-Resilient FPGAs Using Built-In 2-D Hamming Product Code. IEEE Trans. VLSI Syst., 20(2):248-256, 2012. [doi]
@article{ParkLR12,
title = {Soft-Error-Resilient FPGAs Using Built-In 2-D Hamming Product Code},
author = {Sang Phill Park and Dongsoo Lee and Kaushik Roy},
year = {2012},
doi = {10.1109/TVLSI.2010.2095435},
url = {http://dx.doi.org/10.1109/TVLSI.2010.2095435},
researchr = {https://researchr.org/publication/ParkLR12},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {20},
number = {2},
pages = {248-256},
}