Impact of Embedding Scenarios on the Smart Card-Based Fingerprint Verification

Byungkwan Park, Daesung Moon, Yongwha Chung, Jin-Won Park. Impact of Embedding Scenarios on the Smart Card-Based Fingerprint Verification. In Jae Kwang Lee, Okyeon Yi, Moti Yung, editors, Information Security Applications, 7th International Workshop, WISA 2006, Jeju Island, Korea, August 28-30, 2006, Revised Selected Papers. Volume 4298 of Lecture Notes in Computer Science, pages 110-120, Springer, 2006. [doi]

Authors

Byungkwan Park

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Daesung Moon

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Yongwha Chung

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Jin-Won Park

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