Byungkwan Park, Daesung Moon, Yongwha Chung, Jin-Won Park. Impact of Embedding Scenarios on the Smart Card-Based Fingerprint Verification. In Jae Kwang Lee, Okyeon Yi, Moti Yung, editors, Information Security Applications, 7th International Workshop, WISA 2006, Jeju Island, Korea, August 28-30, 2006, Revised Selected Papers. Volume 4298 of Lecture Notes in Computer Science, pages 110-120, Springer, 2006. [doi]
Abstract is missing.