Electrical characteristics of a-IGZO transistors along the in-plane axis during outward bending

Chang Bum Park, HyungIl Na, Soon Sung Yoo, Kwon-Shik Park. Electrical characteristics of a-IGZO transistors along the in-plane axis during outward bending. Microelectronics Reliability, 59:37-43, 2016. [doi]

Abstract

Abstract is missing.