A Defect Detection Model for Casting Product using Wavelet Transform Denoise and Xception - researchr publication related

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Juyong Park, Seokju Oh, Jongpil Jeong. A Defect Detection Model for Casting Product using Wavelet Transform Denoise and Xception. In 24th International Conference on Advanced Communication Technology, ICACT 2022, Pyeongchang, Korea, February 13-16, 2022. pages 247-251, IEEE, 2022. [doi]

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A Defect Detection Model for Imbalanced Wafer Image Data Using CAE and XceptionJaegyeong Cha, Seokju Oh, Donghyun Kim 0005, Jongpil Jeong. idsta 2020: 28-33 [doi]

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