Sparse Bayesian long short-term memory networks for computationally efficient stochastic modeling of plasma etch processes

Damdae Park, Sangwon Ryu, Gon-Ho Kim, Jong Min Lee 0002. Sparse Bayesian long short-term memory networks for computationally efficient stochastic modeling of plasma etch processes. Computers & Chemical Engineering, 159:107696, 2022. [doi]

Abstract

Abstract is missing.