Assessing conformance of pattern-based design in UML

Jaeyong Park, David C. Rine, Elizabeth White. Assessing conformance of pattern-based design in UML. In Proceedings of the 46th Annual Southeast Regional Conference, 2008, Auburn, Alabama, March 28-29, 2008. pages 298-303, ACM, 2008. [doi]

Authors

Jaeyong Park

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David C. Rine

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Elizabeth White

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