Assessing conformance of pattern-based design in UML

Jaeyong Park, David C. Rine, Elizabeth White. Assessing conformance of pattern-based design in UML. In Proceedings of the 46th Annual Southeast Regional Conference, 2008, Auburn, Alabama, March 28-29, 2008. pages 298-303, ACM, 2008. [doi]

@inproceedings{ParkRW08,
  title = {Assessing conformance of pattern-based design in UML},
  author = {Jaeyong Park and David C. Rine and Elizabeth White},
  year = {2008},
  doi = {10.1145/1593105.1593185},
  url = {http://doi.acm.org/10.1145/1593105.1593185},
  tags = {rule-based, UML, C++, design},
  researchr = {https://researchr.org/publication/ParkRW08},
  cites = {0},
  citedby = {0},
  pages = {298-303},
  booktitle = {Proceedings of the 46th Annual Southeast Regional Conference, 2008, Auburn, Alabama, March 28-29, 2008},
  publisher = {ACM},
  isbn = {978-1-60558-105-7},
}