Kink Suppression and High Reliability of Asymmetric Dual Channel Poly-Si Thin Film Transistors for High Voltage Bias Stress

Joong-Hyun Park, Myunghun Shin. Kink Suppression and High Reliability of Asymmetric Dual Channel Poly-Si Thin Film Transistors for High Voltage Bias Stress. IEICE Transactions, 102-C(1):95-98, 2019. [doi]

Abstract

Abstract is missing.