Automatic inspection of assembled PC board via highlight separation and dual channel processing

Jong Seok Park, Julius T. Tou. Automatic inspection of assembled PC board via highlight separation and dual channel processing. In Proceedings of the 1991 IEEE International Conference on Robotics and Automation, Sacramento, CA, USA, 9-11 April 1991. pages 2702-2707, IEEE, 1991. [doi]

Authors

Jong Seok Park

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Julius T. Tou

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