Label Shift Adapter for Test-Time Adaptation under Covariate and Label Shifts

Sunghyun Park, Seunghan Yang, Jaegul Choo, Sungrack Yun. Label Shift Adapter for Test-Time Adaptation under Covariate and Label Shifts. In IEEE/CVF International Conference on Computer Vision, ICCV 2023, Paris, France, October 1-6, 2023. pages 16375-16385, IEEE, 2023. [doi]

@inproceedings{ParkYCY23,
  title = {Label Shift Adapter for Test-Time Adaptation under Covariate and Label Shifts},
  author = {Sunghyun Park and Seunghan Yang and Jaegul Choo and Sungrack Yun},
  year = {2023},
  doi = {10.1109/ICCV51070.2023.01505},
  url = {https://doi.org/10.1109/ICCV51070.2023.01505},
  researchr = {https://researchr.org/publication/ParkYCY23},
  cites = {0},
  citedby = {0},
  pages = {16375-16385},
  booktitle = {IEEE/CVF International Conference on Computer Vision, ICCV 2023, Paris, France, October 1-6, 2023},
  publisher = {IEEE},
  isbn = {979-8-3503-0718-4},
}