Sunghyun Park, Seunghan Yang, Jaegul Choo, Sungrack Yun. Label Shift Adapter for Test-Time Adaptation under Covariate and Label Shifts. In IEEE/CVF International Conference on Computer Vision, ICCV 2023, Paris, France, October 1-6, 2023. pages 16375-16385, IEEE, 2023. [doi]
Abstract is missing.