Young-Min Park, Joonhyeok Yeom, Dohyun Kim, Eui-Young Chung. Unified Wear-Leveling Technique for NVM-Based Buffer of SSD. IEEE Trans. on CAD of Integrated Circuits and Systems, 42(12):5161-5165, December 2023. [doi]
@article{ParkYKC23,
title = {Unified Wear-Leveling Technique for NVM-Based Buffer of SSD},
author = {Young-Min Park and Joonhyeok Yeom and Dohyun Kim and Eui-Young Chung},
year = {2023},
month = {December},
doi = {10.1109/TCAD.2023.3291671},
url = {https://doi.org/10.1109/TCAD.2023.3291671},
researchr = {https://researchr.org/publication/ParkYKC23},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {42},
number = {12},
pages = {5161-5165},
}