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Impact of Random Phase Distribution on Ferroelectric Tunnel Field-Effect Transistors With Mitigation Strategies for Compute-in-Memory Applications

Jiwon Park, Jaemin Yeom, Jin-Wook Lee, Minjeong Ryu, Changhyeon Park, Woo-Young Choi. Impact of Random Phase Distribution on Ferroelectric Tunnel Field-Effect Transistors With Mitigation Strategies for Compute-in-Memory Applications. IEEE Access, 14:8610-8617, 2026. [doi]

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