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Modelling of the threshold voltage distributions of sub-20nm NAND flash memory

Thomas P. Parnell, Nikolaos Papandreou, Thomas Mittelholzer, Haralampos Pozidis. Modelling of the threshold voltage distributions of sub-20nm NAND flash memory. In IEEE Global Communications Conference, GLOBECOM 2014, Austin, TX, USA, December 8-12, 2014. pages 2351-2356, IEEE, 2014. [doi]

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Thomas P. Parnell

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Nikolaos Papandreou

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Thomas Mittelholzer

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Haralampos Pozidis

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