Modelling of the threshold voltage distributions of sub-20nm NAND flash memory

Thomas P. Parnell, Nikolaos Papandreou, Thomas Mittelholzer, Haralampos Pozidis. Modelling of the threshold voltage distributions of sub-20nm NAND flash memory. In IEEE Global Communications Conference, GLOBECOM 2014, Austin, TX, USA, December 8-12, 2014. pages 2351-2356, IEEE, 2014. [doi]

@inproceedings{ParnellPMP14,
  title = {Modelling of the threshold voltage distributions of sub-20nm NAND flash memory},
  author = {Thomas P. Parnell and Nikolaos Papandreou and Thomas Mittelholzer and Haralampos Pozidis},
  year = {2014},
  doi = {10.1109/GLOCOM.2014.7037159},
  url = {http://dx.doi.org/10.1109/GLOCOM.2014.7037159},
  researchr = {https://researchr.org/publication/ParnellPMP14},
  cites = {0},
  citedby = {0},
  pages = {2351-2356},
  booktitle = {IEEE Global Communications Conference, GLOBECOM 2014, Austin, TX, USA, December 8-12, 2014},
  publisher = {IEEE},
}