Eugenio Parra, Luis Alonso, Roy Mendieta, Jose Luis de la Vara. Advances in Artefact Quality Analysis for Safety-Critical Systems. In Katinka Wolter, Ina Schieferdecker, Barbara Gallina, Michel Cukier, Roberto Natella, Naghmeh Ivaki, Nuno Laranjeiro, editors, IEEE International Symposium on Software Reliability Engineering Workshops, ISSRE Workshops 2019, Berlin, Germany, October 27-30, 2019. pages 79-84, IEEE, 2019. [doi]
Abstract is missing.