M. Parrens, Jean-Pierre Wigneron, Philippe Richaume, Yann Kerr, S. Wang, Arnaud Alyaari, R. Fernandez-Moran, Arnaud Mialon, Maria José Escorihuela, J.-P. Grant. Global maps of roughness parameters from L-band SMOS observations. In 2014 IEEE Geoscience and Remote Sensing Symposium, IGARSS 2014, Quebec City, QC, Canada, July 13-18, 2014. pages 4675-4678, IEEE, 2014. [doi]
Abstract is missing.