Owain Parry, Gregory M. Kapfhammer, Michael Hilton, Phil McMinn. Flake It 'Till You Make It: Using Automated Repair to Induce and Fix Latent Test Flakiness. In ICSE '20: 42nd International Conference on Software Engineering, Workshops, Seoul, Republic of Korea, 27 June - 19 July, 2020. pages 11-12, ACM, 2020. [doi]
@inproceedings{ParryKHM20,
title = {Flake It 'Till You Make It: Using Automated Repair to Induce and Fix Latent Test Flakiness},
author = {Owain Parry and Gregory M. Kapfhammer and Michael Hilton and Phil McMinn},
year = {2020},
doi = {10.1145/3387940.3392177},
url = {https://doi.org/10.1145/3387940.3392177},
researchr = {https://researchr.org/publication/ParryKHM20},
cites = {0},
citedby = {0},
pages = {11-12},
booktitle = {ICSE '20: 42nd International Conference on Software Engineering, Workshops, Seoul, Republic of Korea, 27 June - 19 July, 2020},
publisher = {ACM},
isbn = {978-1-4503-7963-2},
}