Owain Parry, Gregory M. Kapfhammer, Michael Hilton, Phil McMinn. Flake It 'Till You Make It: Using Automated Repair to Induce and Fix Latent Test Flakiness. In ICSE '20: 42nd International Conference on Software Engineering, Workshops, Seoul, Republic of Korea, 27 June - 19 July, 2020. pages 11-12, ACM, 2020. [doi]
Abstract is missing.