Owain Parry, Gregory M. Kapfhammer, Michael Hilton, Phil McMinn. Evaluating Features for Machine Learning Detection of Order- and Non-Order-Dependent Flaky Tests. In 15th IEEE Conference on Software Testing, Verification and Validation, ICST 2022, Valencia, Spain, April 4-14, 2022. pages 93-104, IEEE, 2022. [doi]
@inproceedings{ParryKHM22-0,
title = {Evaluating Features for Machine Learning Detection of Order- and Non-Order-Dependent Flaky Tests},
author = {Owain Parry and Gregory M. Kapfhammer and Michael Hilton and Phil McMinn},
year = {2022},
doi = {10.1109/ICST53961.2022.00021},
url = {https://doi.org/10.1109/ICST53961.2022.00021},
researchr = {https://researchr.org/publication/ParryKHM22-0},
cites = {0},
citedby = {0},
pages = {93-104},
booktitle = {15th IEEE Conference on Software Testing, Verification and Validation, ICST 2022, Valencia, Spain, April 4-14, 2022},
publisher = {IEEE},
isbn = {978-1-6654-6679-0},
}