Owain Parry, Gregory M. Kapfhammer, Michael Hilton, Phil McMinn. Evaluating Features for Machine Learning Detection of Order- and Non-Order-Dependent Flaky Tests. In 15th IEEE Conference on Software Testing, Verification and Validation, ICST 2022, Valencia, Spain, April 4-14, 2022. pages 93-104, IEEE, 2022. [doi]
Abstract is missing.