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Surveying the Developer Experience of Flaky Tests

Owain Parry, Gregory M. Kapfhammer, Michael Hilton, Phil McMinn. Surveying the Developer Experience of Flaky Tests. In 44th IEEE/ACM International Conference on Software Engineering: Software Engineering in Practice, ICSE (SEIP) 2022, Pittsburgh, PA, USA, May 22-24, 2022. pages 253-262, IEEE, 2022. [doi]

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