Srivatsan Parthasarathy, Javier A. Salcedo, Sandro Herrera, Jean-Jacques Hajjar. ESD protection clamp with active feedback and mis-trigger immunity in 28nm CMOS process. In IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015. pages 3, IEEE, 2015. [doi]
Abstract is missing.