Praveen Parvathala. High Level Test Generation / SW based Embedded Test. In 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India. pages 459, IEEE Computer Society, 2005. [doi]
@inproceedings{Parvathala05,
title = {High Level Test Generation / SW based Embedded Test},
author = {Praveen Parvathala},
year = {2005},
doi = {10.1109/ATS.2005.64},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2005.64},
tags = {rule-based, testing},
researchr = {https://researchr.org/publication/Parvathala05},
cites = {0},
citedby = {0},
pages = {459},
booktitle = {14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India},
publisher = {IEEE Computer Society},
isbn = {0-7695-2481-8},
}