Virtual Shifting Impedance Method for Extended Range High-Fidelity PHIL Testing - researchr publication authors

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Alexandros G. Paspatis, Alkistis Kontou, Zhiwang Feng, Mazheruddin H. Syed, Georg Lauss, Graeme Burt, Panos Kotsampopoulos, Nikos D. Hatziargyriou. Virtual Shifting Impedance Method for Extended Range High-Fidelity PHIL Testing. IEEE Transactions on Industrial Electronics, 71(3):2903-2913, March 2024. [doi]

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