Virtual Shifting Impedance Method for Extended Range High-Fidelity PHIL Testing

Alexandros G. Paspatis, Alkistis Kontou, Zhiwang Feng, Mazheruddin H. Syed, Georg Lauss, Graeme Burt, Panos Kotsampopoulos, Nikos D. Hatziargyriou. Virtual Shifting Impedance Method for Extended Range High-Fidelity PHIL Testing. IEEE Transactions on Industrial Electronics, 71(3):2903-2913, March 2024. [doi]

@article{PaspatisKFSLBKH24,
  title = {Virtual Shifting Impedance Method for Extended Range High-Fidelity PHIL Testing},
  author = {Alexandros G. Paspatis and Alkistis Kontou and Zhiwang Feng and Mazheruddin H. Syed and Georg Lauss and Graeme Burt and Panos Kotsampopoulos and Nikos D. Hatziargyriou},
  year = {2024},
  month = {March},
  doi = {10.1109/TIE.2023.3269467},
  url = {https://doi.org/10.1109/TIE.2023.3269467},
  researchr = {https://researchr.org/publication/PaspatisKFSLBKH24},
  cites = {0},
  citedby = {0},
  journal = {IEEE Transactions on Industrial Electronics},
  volume = {71},
  number = {3},
  pages = {2903-2913},
}