Giorgio De Pasquale, M. Barbato, V. Giliberto, Gaudenzio Meneghesso, Aurelio Somà . Reliability improvement in microstructures by reducing the impact velocity through electrostatic force modulation. Microelectronics Reliability, 52(9-10):1808-1811, 2012. [doi]
@article{PasqualeBGMS12,
title = {Reliability improvement in microstructures by reducing the impact velocity through electrostatic force modulation},
author = {Giorgio De Pasquale and M. Barbato and V. Giliberto and Gaudenzio Meneghesso and Aurelio Somà },
year = {2012},
doi = {10.1016/j.microrel.2012.06.028},
url = {http://dx.doi.org/10.1016/j.microrel.2012.06.028},
researchr = {https://researchr.org/publication/PasqualeBGMS12},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {52},
number = {9-10},
pages = {1808-1811},
}