High-Sensitivity Tracking of MOSFET Damage Using Dynamic-Mode Transient Measurements

Lucas J. Passmore, Osama O. Awadelkarim, Joseph P. Cusumano. High-Sensitivity Tracking of MOSFET Damage Using Dynamic-Mode Transient Measurements. IEEE T. Instrumentation and Measurement, 59(6):1734-1742, 2010. [doi]

Abstract

Abstract is missing.