Tirth Patel, Fred Lu, Edward Raff, Charles Nicholas, Cynthia Matuszek, James Holt. Small Effect Sizes in Malware Detection? Make Harder Train/Test Splits!. In Lauren Deason, Sagar Samtani, Edward Raff, Ethan M. Rudd, editors, Proceedings of the Conference on Applied Machine Learning in Information Security, Arlington, Virginia, USA, October 19-20, 2023. Volume 3652 of CEUR Workshop Proceedings, pages 181-192, CEUR-WS.org, 2023. [doi]
Abstract is missing.