Harsh N. Patel, Abhishek Roy, Farah B. Yahya, Ningxi Liu, Benton H. Calhoun, Kazuyuki Kumeno, Makoto Yasuda, Akihiko Harada, Taiji Ema. A 55nm Ultra Low Leakage Deeply Depleted Channel technology optimized for energy minimization in subthreshold SRAM and logic. In nd European Solid-State Circuits Conference, Lausanne, Switzerland, September 12-15, 2016. pages 45-48, IEEE, 2016. [doi]
Abstract is missing.