Chintan Patel, Abhishek Singh, Jim Plusquellic. Defect Detection Using Quiescent Signal Analysis. J. Electronic Testing, 21(5):463-483, 2005. [doi]
@article{PatelSP05:0,
title = {Defect Detection Using Quiescent Signal Analysis},
author = {Chintan Patel and Abhishek Singh and Jim Plusquellic},
year = {2005},
doi = {10.1007/s10836-005-2783-7},
url = {http://dx.doi.org/10.1007/s10836-005-2783-7},
tags = {analysis},
researchr = {https://researchr.org/publication/PatelSP05%3A0},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {21},
number = {5},
pages = {463-483},
}