Predicting Crop Yield with Machine Learning: An Extensive Analysis of Input Modalities and Models on a Field and Sub-Field Level

Deepak Pathak, Miro Miranda, Francisco Mena, Cristhian Sanchez, Patrick Helber, Benjamin Bischke, Peter Habelitz, Hiba Najjar, Jayanth Siddamsetty, Diego Arenas, Michaela Vollmer, Marcela Charfuelan, Marlon Nuske, Andreas Dengel 0001. Predicting Crop Yield with Machine Learning: An Extensive Analysis of Input Modalities and Models on a Field and Sub-Field Level. In IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2023, Pasadena, CA, USA, July 16-21, 2023. pages 2767-2770, IEEE, 2023. [doi]

@inproceedings{PathakMMSHBHNSAVCND23,
  title = {Predicting Crop Yield with Machine Learning: An Extensive Analysis of Input Modalities and Models on a Field and Sub-Field Level},
  author = {Deepak Pathak and Miro Miranda and Francisco Mena and Cristhian Sanchez and Patrick Helber and Benjamin Bischke and Peter Habelitz and Hiba Najjar and Jayanth Siddamsetty and Diego Arenas and Michaela Vollmer and Marcela Charfuelan and Marlon Nuske and Andreas Dengel 0001},
  year = {2023},
  doi = {10.1109/IGARSS52108.2023.10282318},
  url = {https://doi.org/10.1109/IGARSS52108.2023.10282318},
  researchr = {https://researchr.org/publication/PathakMMSHBHNSAVCND23},
  cites = {0},
  citedby = {0},
  pages = {2767-2770},
  booktitle = {IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2023, Pasadena, CA, USA, July 16-21, 2023},
  publisher = {IEEE},
  isbn = {979-8-3503-2010-7},
}