Deepak Pathak, Miro Miranda, Francisco Mena, Cristhian Sanchez, Patrick Helber, Benjamin Bischke, Peter Habelitz, Hiba Najjar, Jayanth Siddamsetty, Diego Arenas, Michaela Vollmer, Marcela Charfuelan, Marlon Nuske, Andreas Dengel 0001. Predicting Crop Yield with Machine Learning: An Extensive Analysis of Input Modalities and Models on a Field and Sub-Field Level. In IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2023, Pasadena, CA, USA, July 16-21, 2023. pages 2767-2770, IEEE, 2023. [doi]
Abstract is missing.