Nishad Patil, Diganta Das, Michael G. Pecht. Anomaly detection for IGBTs using Mahalanobis distance. Microelectronics Reliability, 55(7):1054-1059, 2015. [doi]
@article{PatilDP15, title = {Anomaly detection for IGBTs using Mahalanobis distance}, author = {Nishad Patil and Diganta Das and Michael G. Pecht}, year = {2015}, doi = {10.1016/j.microrel.2015.04.001}, url = {http://dx.doi.org/10.1016/j.microrel.2015.04.001}, researchr = {https://researchr.org/publication/PatilDP15}, cites = {0}, citedby = {0}, journal = {Microelectronics Reliability}, volume = {55}, number = {7}, pages = {1054-1059}, }