Diganta Das - researchr alias

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Viewing Publication 1 - 24 from 24

2025

Using sociotechnical network modeling to analyze the impact of blockchain for supply chain on the risk of procuring counterfeit electronic partsHirbod Akhavantaheri, Peter Sandborn, Diganta Das. aei, 65:103272, 2025. [doi]

Analysis of Standards-Based Counterfeit Microelectronics Detection MethodsDevon R. Richman, Michael H. Azarian, Diganta Das, Michael G. Pecht. access, 13:7691-7704, 2025. [doi]

2024

Federated Deep Learning for Monkeypox Disease Detection on GAN-Augmented DatasetDipanjali Kundu, Md. Mahbubur Rahman, Anichur Rahman, Diganta Das, Umme Raihan Siddiqi, Md. Golam Rabiul Alam, Samrat Kumar Dey, Ghulam Muhammad, Zulfiqar Ali 0001. access, 12:32819-32829, 2024. [doi]

Enhancing qualification via the use of diagnostics and prognostics techniquesAbhishek Ram, Diganta Das. qre, 40(8):4352-4364, December 2024. [doi]

2023

One-fault-shot learning for fault severity estimation of gears that addresses differences between simulation and experimental signals and transfer function effectsOmri Matania, Lior Bachar, Varun Khemani, Diganta Das, Michael H. Azarian, Jacob Bortman. aei, 56:101945, April 2023. [doi]

2021

An Assessment of Validity of the Bathtub Model Hazard Rate Trends in ElectronicsAishwarya Gaonkar, Rajkumar B. Patil, San Kyeong, Diganta Das, Michael G. Pecht. access, 9:10282-10290, 2021. [doi]

Nonparametric Model-Based Online Junction Temperature and State-of-Health Estimation for Insulated Gate Bipolar TransistorsXiangxiang Liu, Tianlei Jiao, Diganta Das, Ijaz Haider Naqvi, Michael G. Pecht. access, 9:95304-95316, 2021. [doi]

2020

Online Degradation State Assessment Methodology for Multi-Mode Failures of Insulated Gate Bipolar TransistorXiangxiang Liu, Lingling Li, Diganta Das, Ijaz Haider Naqvi, Michael G. Pecht. access, 8:69471-69481, 2020. [doi]

2019

2018

Analysis of indentation measured mechanical properties on Multilayer Ceramic Capacitors (MLCCs)Nga Man Li, Subramani Manoharan, Diganta Das, F. Patrick McCluskey. mr, 88:528-533, 2018. [doi]

2016

Thermal reliability prediction and analysis for high-density electronic systems based on the Markov processYi Wan, Hailong Huang, Diganta Das, Michael G. Pecht. mr, 56:182-188, 2016. [doi]

2015

Anomaly detection for IGBTs using Mahalanobis distanceNishad Patil, Diganta Das, Michael G. Pecht. mr, 55(7):1054-1059, 2015. [doi]

2014

Anomaly Detection of Light-Emitting Diodes Using the Similarity-Based Metric TestMoon-Hwan Chang, Chaochao Chen, Diganta Das, Michael G. Pecht. tii, 10(3):1852-1863, 2014. [doi]

2013

Long term storage reliability of antifuse field programmable gate arraysNishad Patil, Diganta Das, Estelle Scanff, Michael Pecht. mr, 53(12):2052-2056, 2013. [doi]

2012

Light emitting diodes reliability reviewMoon-Hwan Chang, Diganta Das, P. V. Varde, Michael G. Pecht. mr, 52(5):762-782, 2012. [doi]

A prognostic approach for non-punch through and field stop IGBTsNishad Patil, Diganta Das, Michael G. Pecht. mr, 52(3):482-488, 2012. [doi]

2011

Using Failure Modes, Mechanisms, and Effects Analysis in Medical Device Adverse Event InvestigationsShunfeng Cheng, Diganta Das, Michael G. Pecht. icbo 2012: [doi]

Prognostics-based health management for telecom equipment under free air coolingJun Dai, Diganta Das, Michael G. Pecht. eurocon 2011: 1-4 [doi]

2010

Mahalanobis Distance Approach for Insulated Gate Bipolar Transistors DiagnosticsNishad Patil, Diganta Das, Michael Pecht. ispe 2010: 643-651 [doi]

2009

Precursor Parameter Identification for Insulated Gate Bipolar Transistor (IGBT) PrognosticsNishad Patil, Jose Celaya, Diganta Das, Kai Goebel, Michael G. Pecht. tr, 58(2):271-276, 2009. [doi]

2002

The IEEE standards on reliability program and reliability prediction methods for electronic equipmentMichael G. Pecht, Diganta Das, Arun Ramakrishnan. mr, 42(9-11):1259-1266, 2002. [doi]

1996

Generating redesign suggestions to reduce setup cost: a step towards automated redesignDiganta Das, Satyandra K. Gupta, Dana S. Nau. cad, 28(10):763-782, 1996. [doi]

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