Peter Sandborn - researchr alias

researchr

You are not signed in
Sign in
Sign up

Viewing Publication 1 - 23 from 23

2025

Using sociotechnical network modeling to analyze the impact of blockchain for supply chain on the risk of procuring counterfeit electronic partsHirbod Akhavantaheri, Peter Sandborn, Diganta Das. aei, 65:103272, 2025. [doi]

2024

Analyzing the Influence of Processor Speed and Clock Speed on Remaining Useful Life Estimation of Software SystemsMohammad Rubyet Islam, Peter Sandborn. sai 2024: 490-507 [doi]

2022

System Sustainment - Acquisition and Engineering Processes for the Sustainment of Critical and Legacy SystemsPeter Sandborn, William Lucyshyn. Volume 4 of World Scientific Series on Emerging Technologies, WorldScientific, 2022. [doi]

2015

2013

Ontology-Based Knowledge Representation for Obsolescence ForecastingLiyu Zheng, Raymond Nelson, Janis P. Terpenny, Peter Sandborn. jcise, 13(1), 2013. [doi]

2012

A part total cost of ownership model for long life cycle electronic systemsVarun J. Prabhakar, Peter Sandborn. ijcim, 25(4-5):384-397, 2012. [doi]

2011

Forecasting electronic part procurement lifetimes to enable the management of DMSMS obsolescencePeter Sandborn, V. Prabhakar, O. Ahmad. mr, 51(2):392-399, 2011. [doi]

2009

A Methodology for Determining the Return on Investment Associated With Prognostics and Health ManagementKiri Feldman, Taoufik Jazouli, Peter Sandborn. tr, 58(2):305-316, 2009. [doi]

2007

Introduction to special section on electronic systems prognostics and health managementPeter Sandborn, Michael G. Pecht. mr, 47(12):1847-1848, 2007. [doi]

Life cycle cost impact of using prognostic health management (PHM) for helicopter avionicsE. Scanff, K. L. Feldman, S. Ghelam, Peter Sandborn, M. Glade, B. Foucher. mr, 47(12):1857-1864, 2007. [doi]

2006

Optimization of Test/Diagnosis/Rework Location(s) and Characteristics in Electronic System AssemblyZhen Shi, Peter Sandborn. et, 22(1):49-60, 2006. [doi]

2005

A warranty forecasting model based on piecewise statistical distributions and stochastic simulationAndre Kleyner, Peter Sandborn. ress, 88(3):207-214, 2005. [doi]

2003

Optimization of Test/Diagnosis/Rework Location(s) and Characteristics in Electronic Systems Assembly Using Real-Coded Genetic AlgorithmsZhen Shi, Peter Sandborn. itc 2003: 937-946 [doi]

2002

A detailed cost model for concurrent use with hardware/software co-designDaniel Ragan, Peter Sandborn, Paul Stoaks. dac 2002: 269-274 [doi]

2001

Process capability indices and product reliabilityBharatwaj Ramakrishnan, Peter Sandborn, Michael G. Pecht. mr, 41(12):2067-2070, 2001. [doi]

A new test/diagnosis/rework model for use in technical cost modeling of electronic systems assemblyThiagarajan Trichy, Peter Sandborn, Ravi Raghavan, Shubhada Sahasrabudhe. itc 2001: 1108-1117

1998

Analyzing Packaging Trade-Offs During System DesignPeter Sandborn, Mike Vertal. dt, 15(3):10-19, 1998. [doi]

1997

Economic Analysis of Test Process Flows for Multichip Modules Using Known Good DieCynthia F. Murphy, Magdy S. Abadir, Peter Sandborn. et, 10(1-2):151-166, 1997. [doi]

1994

Analyzing Multichip Module Testing StrategiesMagdy S. Abadir, Ashish R. Parikh, Linda Bal, Peter Sandborn, Ken Drake. dt, 11(1):40-52, 1994. [doi]

High Level Test Economics Advisor (Hi-TEA)Magdy S. Abadir, Ashish Parikh, Linda Bal, Peter Sandborn, Cynthia F. Murphy. et, 5(2-3):195-206, 1994. [doi]

Multichip systems trade-off analysis toolPeter Sandborn, Rajarshi Ghosh, Ken Drake, Magdy S. Abadir, Linda Bal, Ashish Parikh. et, 5(2-3):207-218, 1994. [doi]

Sign in or sign up to see more results.

runs on WebDSL