Peter Sandborn - researchr alias

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Viewing Publication 1 - 21 from 21

2022

System Sustainment - Acquisition and Engineering Processes for the Sustainment of Critical and Legacy SystemsPeter Sandborn, William Lucyshyn. Volume 4 of World Scientific Series on Emerging Technologies, WorldScientific, 2022. [doi]

2015

2013

Ontology-Based Knowledge Representation for Obsolescence ForecastingLiyu Zheng, Raymond Nelson, Janis P. Terpenny, Peter Sandborn. jcise, 13(1), 2013. [doi]

2012

A part total cost of ownership model for long life cycle electronic systemsVarun J. Prabhakar, Peter Sandborn. ijcim, 25(4-5):384-397, 2012. [doi]

2011

Forecasting electronic part procurement lifetimes to enable the management of DMSMS obsolescencePeter Sandborn, V. Prabhakar, O. Ahmad. mr, 51(2):392-399, 2011. [doi]

2009

A Methodology for Determining the Return on Investment Associated With Prognostics and Health ManagementKiri Feldman, Taoufik Jazouli, Peter Sandborn. tr, 58(2):305-316, 2009. [doi]

2007

Introduction to special section on electronic systems prognostics and health managementPeter Sandborn, Michael G. Pecht. mr, 47(12):1847-1848, 2007. [doi]

Life cycle cost impact of using prognostic health management (PHM) for helicopter avionicsE. Scanff, K. L. Feldman, S. Ghelam, Peter Sandborn, M. Glade, B. Foucher. mr, 47(12):1857-1864, 2007. [doi]

2006

Optimization of Test/Diagnosis/Rework Location(s) and Characteristics in Electronic System AssemblyZhen Shi, Peter Sandborn. et, 22(1):49-60, 2006. [doi]

2005

A warranty forecasting model based on piecewise statistical distributions and stochastic simulationAndre Kleyner, Peter Sandborn. ress, 88(3):207-214, 2005. [doi]

2003

Optimization of Test/Diagnosis/Rework Location(s) and Characteristics in Electronic Systems Assembly Using Real-Coded Genetic AlgorithmsZhen Shi, Peter Sandborn. itc 2003: 937-946 [doi]

2002

A detailed cost model for concurrent use with hardware/software co-designDaniel Ragan, Peter Sandborn, Paul Stoaks. dac 2002: 269-274 [doi]

2001

Process capability indices and product reliabilityBharatwaj Ramakrishnan, Peter Sandborn, Michael G. Pecht. mr, 41(12):2067-2070, 2001. [doi]

A new test/diagnosis/rework model for use in technical cost modeling of electronic systems assemblyThiagarajan Trichy, Peter Sandborn, Ravi Raghavan, Shubhada Sahasrabudhe. itc 2001: 1108-1117

1998

Analyzing Packaging Trade-Offs During System DesignPeter Sandborn, Mike Vertal. dt, 15(3):10-19, 1998. [doi]

1997

Economic Analysis of Test Process Flows for Multichip Modules Using Known Good DieCynthia F. Murphy, Magdy S. Abadir, Peter Sandborn. et, 10(1-2):151-166, 1997. [doi]

1994

Analyzing Multichip Module Testing StrategiesMagdy S. Abadir, Ashish R. Parikh, Linda Bal, Peter Sandborn, Ken Drake. dt, 11(1):40-52, 1994. [doi]

High Level Test Economics Advisor (Hi-TEA)Magdy S. Abadir, Ashish Parikh, Linda Bal, Peter Sandborn, Cynthia F. Murphy. et, 5(2-3):195-206, 1994. [doi]

Multichip systems trade-off analysis toolPeter Sandborn, Rajarshi Ghosh, Ken Drake, Magdy S. Abadir, Linda Bal, Ashish Parikh. et, 5(2-3):207-218, 1994. [doi]

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