Online Degradation State Assessment Methodology for Multi-Mode Failures of Insulated Gate Bipolar Transistor

Xiangxiang Liu, Lingling Li, Diganta Das, Ijaz Haider Naqvi, Michael G. Pecht. Online Degradation State Assessment Methodology for Multi-Mode Failures of Insulated Gate Bipolar Transistor. IEEE Access, 8:69471-69481, 2020. [doi]

Abstract

Abstract is missing.