Xiangxiang Liu, Lingling Li, Diganta Das, Ijaz Haider Naqvi, Michael G. Pecht. Online Degradation State Assessment Methodology for Multi-Mode Failures of Insulated Gate Bipolar Transistor. IEEE Access, 8:69471-69481, 2020. [doi]
@article{LiuLDNP20,
title = {Online Degradation State Assessment Methodology for Multi-Mode Failures of Insulated Gate Bipolar Transistor},
author = {Xiangxiang Liu and Lingling Li and Diganta Das and Ijaz Haider Naqvi and Michael G. Pecht},
year = {2020},
doi = {10.1109/ACCESS.2020.2984385},
url = {https://doi.org/10.1109/ACCESS.2020.2984385},
researchr = {https://researchr.org/publication/LiuLDNP20},
cites = {0},
citedby = {0},
journal = {IEEE Access},
volume = {8},
pages = {69471-69481},
}