Nishad Patil, Diganta Das, Michael Pecht. Mahalanobis Distance Approach for Insulated Gate Bipolar Transistors Diagnostics. In Jerzy Pokojski, Shuichi Fukuda, Józef Salwinski, editors, New World Situation: New Directions in Concurrent Engineering, Proceedings of the 17th ISPE International Conference on Concurrent Engineering, Cracow, Poland, September 6-10, 2010. pages 643-651, Springer, 2010. [doi]
Abstract is missing.