Zachary D. Patitz, Nohpill Park. Modeling and Evaluation of Threshold Defect Tolerance. In Cristiana Bolchini, Yong-Bin Kim, Dimitris Gizopoulos, Mohammad Tehranipoor, editors, 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2008), 1-3 October 2008, Boston, MA, USA. pages 211-219, IEEE Computer Society, 2008. [doi]
@inproceedings{PatitzP08,
title = {Modeling and Evaluation of Threshold Defect Tolerance},
author = {Zachary D. Patitz and Nohpill Park},
year = {2008},
doi = {10.1109/DFT.2008.56},
url = {http://dx.doi.org/10.1109/DFT.2008.56},
tags = {modeling},
researchr = {https://researchr.org/publication/PatitzP08},
cites = {0},
citedby = {0},
pages = {211-219},
booktitle = {23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2008), 1-3 October 2008, Boston, MA, USA},
editor = {Cristiana Bolchini and Yong-Bin Kim and Dimitris Gizopoulos and Mohammad Tehranipoor},
publisher = {IEEE Computer Society},
}