Zachary D. Patitz, Nohpill Park, Minsu Choi, Fred J. Meyer. QCA-Based Majority Gate Design under Radius of Effect-Induced Faults. In 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 3-5 October 2005, Monterey, CA, USA. pages 217-228, IEEE Computer Society, 2005. [doi]
Abstract is missing.