An event-driven transient simulation algorithm for MOS and bipolar circuits

D. Patrick, C. Lyden. An event-driven transient simulation algorithm for MOS and bipolar circuits. In Gordon Adshead, Jochen A. G. Jess, editors, European Design Automation Conference, EURO-DAC 1990, Glasgow, Scotland, UK, March 12-15, 1990. pages 230-234, IEEE Computer Society, 1990. [doi]

@inproceedings{PatrickL90,
  title = {An event-driven transient simulation algorithm for MOS and bipolar circuits},
  author = {D. Patrick and C. Lyden},
  year = {1990},
  doi = {10.1145/949970.950022},
  url = {http://doi.acm.org/10.1145/949970.950022},
  tags = {C++},
  researchr = {https://researchr.org/publication/PatrickL90},
  cites = {0},
  citedby = {0},
  pages = {230-234},
  booktitle = {European Design Automation Conference, EURO-DAC 1990, Glasgow, Scotland, UK, March 12-15, 1990},
  editor = {Gordon Adshead and Jochen A. G. Jess},
  publisher = {IEEE Computer Society},
  isbn = {0-8186-2024-2},
}